RLDRAM 内存

Rldram

针对网络设计

RLDRAM 内存是一种低延迟、高带宽的 DRAM,专为要求较高的网络任务、三级缓存及其他需要进行交替读写操作或需要完全随机存取的应用打造。

dish sunsetRLDRAM® Memory:无与伦比的带宽与低延迟

实现可持续的高带宽
Our reduced-latency DRAM (RLDRAM® memory) is a high-performance, high-density memory solution that offers fast SRAM-like random access and outpaces even leading-edge DDR3 for sustained high bandwidth.RLDRAM 使用创新电路设计,将存取周期开始到获得第一个数据的间隔时间减至最少。极低的总线周转时间实现了持续高带宽和短期平衡的读写比率。安排的自动刷新功能使控制器在正常运行后台隐藏刷新命令,以此来增加带宽。这些特点使 RLDRAM 成为 10GbE、40GbE 和 100GbE 数据包缓冲及检查的理想选择,且在各种 FPGA 和网络处理器解决方案中均受支持。

RLDRAM 2和3部件目录与文档

RLDRAM 3 — 了解新一代最佳低延迟内存
低延迟内存解决方案现已升级到第三代,其密度和速度进一步提高,延迟时间更短,用于高性能网络应用程序时功耗更低。

  •     超高的数据速率和更低的 DRAM 随机存取延迟:<8ns tRC versus 46–52ns for DDR3.
  •    多储蓄库写入:Enables random read accesses with 1ns tRC.
  •    Minimal bus turnaround delay:单一 IDLE 循环的读 - 写 - 读延迟(DDR3 的 IDLE 循环达 15 次或更多)。
  •     No tFAW, tRRD:循环的储蓄库存取间无 IDLE 循环(DDR3 的 tFAW 高达 27 或更多循环)。
  •    最短的突发长度:通过采用 BL2、BL4 和 BL8 总线,实现灵活的内存存取并充分提高数据总线利用率。
我们对 RLDRAM 3 经过精心设计,使其易于实施,帮助您更好地利用现有的 RLDRAM2 和 DDR3 PHY。

若要了解详细的技术信息或索取样品,请联系我们

RLDRAM 2——已经采用 RLDRAM 2?我们也为您准备好了升级。
The introduction of RLDRAM 3 doesn’t mean current-generation RLDRAM 2 will be left behind.In fact, our RLDRAM 2 products are migrating to a more advanced 50nm process technology, reducing power consumption across the board and upgrading the current 288Mb device to 1066 Mb/s and 15ns tRC.在未来几年中,我们都将努力为 RLDRAM 2 提供支持并提高其性能。

  •    576Mb RL2 压缩 (SIO/CIO) – 主工作电流减少 33%,最高减少 40% 以上
  •    288Mb RL2 压缩 (CIO) – 主工作电流减少 25%,最高减少 40% 以上
  •    288Mb RL2 压缩 (SIO) – 主工作电流减少 10%,最高减少 25% 以上

  规格     Benefit
密度  288Mb, 576Mb Available in two densities, providing flexibility for many designs
配置 x9, x18, x36 Available in wide bus widths with minimal part counts in wide-bus configured systems; common or separate I/O
供电电压 1.8V core; 1.5V or 1.8V I/O HSTL and SSTL I/O compatibility
时钟频率 200–533 MHz Achieves 400–1,067 Mb/s per pin
温度范围 0°C to +95°C
40°C to +95°C
Increased operating range for optimum functionality in extreme environments
Latency tRC = 8ns Fast random access
Bandwidth Up to 38.4 Gb/s High sustainable performance
Improved Signal Integrity Programmable Output Impedance Enables clean, high-frequency operation
Addressing Multiplexed/Non-Multiplexed Address Modes Adds flexibility to board design
Fault Detection JTAG Boundary Scan Essential for testing boards with a high number of components

RLDRAM 3 Design Guide

Learn more about the new features and functions of RLDRAM 3 with our Design Guide.The Guide contains practical recommendations that enable board designers to develop a high-performance memory subsystem while ensuring stability for long-term reliable operation of the device.For more information,see our RLDRAM 3 Design Guide.

类型 安全 标题和描述 编号 更新日期 文件大小
IBIS Behavioral Models: 美光多年前就已成为 IBIS 开放论坛的一员,完全支持 IBIS 规范。美光的网站上提供其大部分产品的 IBIS 模型以供下载。 TN-00-07 2009/11 163.98 KB
Thermal Applications: 定义了测量和确保美光零件和模块不超过允许的最高温度的一般方法和标准 TN-00-08 2010/05 252.18 KB
Understanding Quality and Reliability Requirements for Bare Die Applications: 介绍了 Bare Die 应用的质量和可靠性要求 TN-00-14 2009/10 152.83 KB
Recommended Soldering Parameters: 定义了美光科技公司产品的推荐连接技术和参数。 TN-00-15 2007/03 69.09 KB
Uprating of Semiconductors for High-Temperature Applications: 描述了与提升温度有关的问题,以及在制造环境规范之外使用零件和/或系统的相关风险 TN-00-18 2010/05 428.33 KB
Understanding Signal Integrity: 描述了从新产品构思直至产品寿命结束的整个过程中,如何发挥内存设计、测试和验证工具的最大优势 TN-00-20 2009/12 1.52 MB
SEMI Wafer Map Format: 美光采用了经国际半导体设备与材料联盟 (SEMI) 批准的晶圆图文件格式。使用 SEMI 的格式,美光的客户可以放心,因为他们将始终收到规格统一、兼容、可靠的晶圆图文件。 TN-00-21 2009/02 110 KB
RLDRAM 2 Design Guide: Describes the general features of circuit implementations using RLDRAM 2 memory architecture TN-49-01 2008/06 329.19 KB
Exploring the RLDRAM 2 Feature Set: Outlines the performance-enhancing features offered by RLDRAM 2 architecture TN-49-02 2006/12 453.86 KB
RLDRAM 2 Clocking Strategies: Addresses the operation of the RLDRAM 2 device outside the specified range of clock periods and the timing changes that occur in this mode of operation TN-49-03 2007/05 305.07 KB
Calculating Memory System Power for RLDRAM 2: Details how RLDRAM 2 devices consume power and provides tools to estimate power consumption TN-49-04 2007/11 1.64 MB
PCN/EOL Systems: 介绍了美光产品的变更通知和寿命终结系统。 CSN-12 2012/04 79.21 KB
Wafer Packaging and Packaging Materials: 提供了有关装运美光产品时使用的各种材料的完整装运和回收信息。 CSN-20 2011/09 776.24 KB
Bare Die SiPs and MCMs: 描述了 Bare Die SiP 和 MCM 的设计考虑因素。 CSN-18 2009/04 151.06 KB
Shipping Quantities: 提供了料件数量表格。 CSN-04 2012/04 472.27 KB
Micron KGD Definitions: 描述了美光 KGD-C1 和 KGD-C2 DRAM 芯片的测试规格和参数 CSN-22 2009/07 65.52 KB
Micron Component and Module Packaging: 解释了美光的封装标签和程序。 CSN-16 2012/02 887.13 KB
ESD Precautions for Die/Wafer Handling and Assembly: 介绍了在工作场所中控制 ESD 的好处,包括提高产量和改善质量与可靠性,最终可以缩减制造成本。 CSN-24 2010/08 119.08 KB
Electronic Data Interchange: 描述了 EDI 传输的装置、协议和联系方式。 CSN-06 2005/09 53.5 KB
RMA Procedures for Packaged Product and Bare Die Devices: 概括介绍了标准的退货授权 (RMA) 程序,以及与 bare die RMA 的对比。 CSN-07 2010/10 82.64 KB
ISO System Management Standards: 描述了 ISO 系统管理标准。 CSN-08 2004/04 39.18 KB
The Future of Memory and Storage: 概述了主存和闪存的发展趋势 2009/12 1.54 MB
RLDRAM II Power Calculator 2011/08 281 KB
DRAM Component Part Numbering System: DDR3/DDR2/DDR/SDR SDRAM、Mobile LPDRAM 和 RLDRAM 零件的料件编号向导 2012/04 36.89 KB
FBGA Date Codes: FBGA 封装零件的日期代码 2005/08 22.36 KB
Moisture Absorption in Plastic Packages: Describes shipping procedures for preventing memory devices from absorbing moisture and recommendations for baking devices exposed to excessive moisture TN-00-01 2010/02 87.26 KB
Accelerate Design Cycles with Simulation Models: 美光会提供必要的工具和指导,以在实际布局前对新设计进行检验。此技术要点讨论了软件模型支持、信号保真性优化和逻辑电路设计。 TN-00-09 2010/02 206.91 KB
Micron Wire-Bonding Techniques: 此技术要点提供了丝焊技术的指导,可用于美光产品的镍钯 (NiPd) 和铝制接合焊盘。 TN-00-22 2010/11 66.13 KB
Leverage Existing RLDRAM® 2 and DDR3 PHY to Design in New RLDRAM: RLDRAM 3 and DDR3 PHY features comparison, highlighting how both RLDRAM 2 and DDR3 PHY can be easily leveraged to design in RLDRAM 3. 演示 2011/05 75.75 KB
Micron BGA Manufacturer's User Guide: 提供相关信息,帮助顾客轻松将最前沿的和传统的美光球栅阵列 (BGA) 封装整合到制造流程中。此指南旨在提供一系列高水平指导,并附有参考手册,其中介绍了封装相关和制造工艺流程的典型做法。 CSN-33 2011/07 353.32 KB
RLDRAM 3 Design Guide: Contains practical recommendations for developing high-performance memory subsystems while ensuring stability for long-term reliable operation of the devices. TN-44-01 2011/08 723.41 KB
RLDRAM 3 Power Calculator 2011/08 290 KB
Product Marks/Product and Packaging Labels: 介绍了产品料件的标记,以及产品和封装的标签。 CSN-11 2012/04 724.89 KB
RLDRAM Memory Flyer : Describes the high-bandwidth, low-latency, high-density features of RLDRAM 3 and RLDRAM 2 memory 产品宣传页 2012/02 738.96 KB
Bypass Capacitor Selection for High-Speed Designs: 描述了高速设计的旁路电容选择。 TN-00-06 2011/03 481.9 KB

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Are CK/CK# and DK/DK# true differential inputs?
Yes, the CK/CK# and DK/DK# input buffers are true differential inputs.Both sets of clocks need to meet the specifications that are defined in the Clock Input Operating Conditions tables in the RLDRAM II memory data sheets.
Are there any new features in RLDRAM 3 not found in earlier generations of the RLDRAM product line?
Yes. Multibank write is a new feature that enables SRAM-like random read capabilities.Managing refresh overhead is now more flexible than ever with the addition of the MULTIBANK REFRESH command.With this command, you can refresh one to four banks simultaneously.We’ve also added a mirror function ball to ease layout of clamshell designs.Depending upon the state of the mirror function ball, the command and address functions are swapped across the y-axis to allow for direct connections through the PCB.
Can 2.5V or 3.3V be directly input to joint test action group (JTAG) pins?
No. The highest operating voltage that can be input to the JTAG pins is VDD + 0.3V as outlined in the TAP DC Electrical Characteristics and Operating Conditions tables in the RLDRAM II data sheets.
Can I connect the “Do Not Use” (DNU) pins to ground (GND)?
Yes. However, when on-die termination (ODT) is enabled, the DNU pins will be connected to VTT.Connecting the DNU pins to GND under these circumstances will cause a substantially larger load on your VTT supply.
Can I reload the mode register after I have been operating with READs and WRITEs on RLDRAM II memory?
Yes, the mode register can be reloaded at any time as long as all timing specifications are met.Burst length must be considered, however.If the burst length is changed, previously written data will be corrupted.
Can RLDRAM II run slower than 175 MHz?
Yes, but the DLL must be turned off.With the DLL turned off, the output data alignment with the CK will shift by about 3–4ns, which works like the outputs of RLDRAM I memory.
Does the 576Mb RLDRAM II device still support 1.8V VDDQ?Is it possible to run at 533 MHz with VDDQ = 1.8V?
It should not be a problem to run at 533 MHz with VDDQ = 1.8V. Micron has run graphics devices at 800 MHz clock at 1.8V.
Does the RLDRAM internally compensate for voltage and temperature changes when bit A8 is not selected HIGH on the RLDRAM II during setting of the mode register?
Yes. When bit A8 of the mode register is HIGH, the user places an external precision resistor between ZQ and VSS to select an output impedance.When bit A8 is LOW, the output impedance is set to 50 ohms (±30 percent).In both cases, however, the RLDRAM device periodically calibrates this impedance to compensate for shifts in voltage and temperature.This calibration is internal to the RLDRAM and does not affect the operation of the RLDRAM.
During initialization, are 2,048 clock cycles really needed between each AUTO REFRESH command?
No. Although it is still outlined in some older data sheet revisions, it is not necessary.During initialization, it is necessary for all eight banks to receive an AUTO REFRESH command tMRSC after the last valid MRS command has been issued.If you sequentially issue AUTO REFRESH commands instead of waiting 2,048 clock cycles between each command, you must perform at least 1,024 NOP commands between the last AUTO REFRESH command and the first valid command in normal operation.Either method will satisfy the requirements of the RLDRAM.
During power-up, I bring VDDQ HIGH before VDD.Will this cause a problem?
The RLDRAM II will not be adversely affected if you bring VDDQ HIGH before VDD.However, you must be aware that when you perform the sequence in this way, the DQs, DM, and all other pins with an output driver will go HIGH instead of tri-stating.These pins will remain HIGH until VDD is at the same level as VDDQ.Care should be taken to avoid bus conflicts during this period.
How can I reset the RLDRAM II device?
RLDRAM II memory can be reset using the MODE REGISTER command.Three MRS commands must be issued on consecutive clock cycles to reset the device properly.If any commands (including NOP commands) are issued between the MRS commands, the device will not be reset.
How is RLDRAM II memory similar to SRAM?
RLDRAM II memory is similar to SRAM in a variety of ways:- Simplified command set:only four commands (READ, WRITE, REFRESH, and MODE REGISTER SELECTION) - Row/columns not apparent:can clock in the full address in one clock cycle (or can be multiplexed like a standard DRAM) - Fast cycle time:20ns tRC for the 288Mb device and as low as to 15ns tRC for the 576Mb device
I’m using RLDRAM memory.Is it possible to tie VDD and VDDQ to the same supply?
Yes. You can tie VDD and VDDQ to the same supply.
Is MAX power specified in the data sheet?
Yes, MAX power is specified in the data sheet.Because MAX power is entirely dependent on how the devices are used in a system, the power must be calculated based on information found in the data sheet.In addition to the information found in the data sheet, Micron’s Web site provides a system power calculator to help calculate MAX power based on system use conditions.
Is the tRC timing parameter asynchronous?
No. You must wait the number of clock cycles that correspond with the tRC value for a given configuration before you issue a command to the same bank.For example, if you are using configuration three, you must wait eight clock cycles before you issue another command to the same bank regardless of the operating frequency.
I’ve heard about the new multibank write feature on RLDRAM 3.What exactly is this feature?
Multibank write is a feature that allows for SRAM-like random read access time.Using this feature can reduce RLDRAM 3’s already low tRC (<10ns) by up to 75% during reads.Through the RLDRAM 3 mode register, you can choose to write to one, two, or four banks simultaneously.By storing identical data in multiple banks, the memory controller has the flexibility to determine which bank to read the data from in order to minimize tRC delay.
I’ve heard you’ll be sampling RLDRAM 3 memory in 2011.Do I need to switch to RLDRAM 3?
Not necessarily.While RLDRAM 3 memory offers several performance advantages over RLDRAM 2 memory (it’s twice as fast), we plan to support RLDRAM 2 for a long time.So there’s no urgent need to roll your design.In fact, our die shrink for RLDRAM 2 memory (also coming in 2011) shouldn’t necessitate a design change for existing customers.Contact your Micron representative if you have questions.
Now that you’re introducing RLDRAM 3 technology, should I be concerned about the lifespan for RLDRAM 2 memory?
No. While we’re developing RLDRAM 3 technology we’re also updating the design for RLDRAM 2 memory, transitioning it to our leading 300mm fabs.This process shrink will reduce power consumption and increase performance for the 288Mb product, but most importantly, it will allow us to support RLDRAM 2 memory well into the next decade.
What termination values does DDR3 offer?
DDR3 supports Rtt_Nom values of 120, 60, 40, 30, and 20 ohms.Dynamic ODT (Rtt_Wr) values are 120 and 60 ohms.
When can I get RLDRAM 3 memory?
Early RL 3 samples are available now, with qualified (QS) parts expected in fall 2011, and production beginning at the end of 2011.For more information, request an RLDRAM 3 data sheet.
When I upgrade my system memory from 288Mb to 576Mb RLDRAM II, what design considerations do I need to pay attention to?
The 576Mb RLDRAM II device has been designed as a drop-in solution when upgrading from the 288Mb density.Only one additional address pin is needed to support this upgrade.Also, because of the increase in density, the 576Mb device must be refreshed twice as often as the 288Mb device (131,072 refresh commands for the 576Mb device versus 65,536 refresh commands for the 288Mb device every 32ms).The 576Mb device should meet all other existing timing specifications for a comparable 288Mb speed grade.
Which high-speed transceiver logic (HSTL) class do the RLDRAM II DQs comply with?
The RLDRAM II DQs comply both with HSTL class I and HSTL class II because the DQs’ output impedance can be selected to meet the IOH/IOL requirements of each class.The output impedance is selectable when the MRS bit A8 is set HIGH and an external precision resistor is connected to the ZQ pin.Output impedance values of 25–60 ohms can be chosen when a resistor of five times the desired value is placed between the ZQ ball and VSS.For example, a 300 ohm resistor is required for an output impedance of 60 ohms.With the option of using a 1.8V output voltage and programmable output impedance, the RLDRAM II can also operate in an SSTL environment, although it is not compliant with this standard.
Will I be able to leverage any existing DRAM technology to ease the adoption of RLDRAM 3 in my system?
Yes. Even though RLDRAM 3 is a new architecture, it leverages many features from both DDR3 and RLDRAM 2 to make adoption and integration as easy as possible.The command protocol, addressing, and strobing scheme are the same as RLDRAM 2, while the I/O, AC timing, and read training register very closely resemble those found in DDR3.
I’m seeing substantial jitter on my outputs; what can I do to remedy this?
A number of things can cause jitter on RLDRAM II memory outputs.Read through the questions below to help identify the cause of the jitter.- Is the same amount of jitter seen at the DQs, QKs, and QVLD signal?If so, the jitter may be due to the DLL.The DQs, QKs, and QVLD all use the DLL to clock out their data.Micron can assist with additional debugging to determine whether any parameters are being violated that would cause the DLL to operate improperly.
- Is there jitter on the input clocks?Any jitter on CK/CK# will be transferred to the outputs.
- Does the amount of jitter change substantially with different output data?If it does, phenomena such as ISI, SSO, or crosstalk could be causing the jitter.
- Is the system properly terminated?Because proper termination is dependent on system parameters, simulation is the best way to determine termination requirements.Micron offers several tools and technical notes to assist with termination requirements:
1.“TN-49-02:Exploring the RLDRAM II Feature Set” includes descriptions and examples of data-eyes when using the on-die termination and impedance-matching features.
2.Technical notes TN-46-14 and TN-46-06 do not specifically mention RLDRAM II memory, but they have useful information about termination and techniques to ensure good signal integrity.
3.The RLDRAM Memory Part Catalog contains configuration information for IBIS and HSpice models.